[IEEE 2007 Proceedings 57th Electronic Components and Technology Conference - Sparks, NV, USA (2007.05.29-2007.06.1)] 2007 Proceedings 57th Electronic Components and Technology Conference - Comprehensive Assembly and Reliability Study of 0201's for High Reliability Applications for Utilizing both a Pb-Free and Sn/Pb Assembly Process
Ramakrishna, Gnyaneshwar, Nandagopal, Bala, Dick, Tim, Burton, Anthony, Higdon, Reggie, Anvari, Mike, Hu, Mason, Teng, Sue, Xue, JieYear:
2007
Language:
english
DOI:
10.1109/ectc.2007.373965
File:
PDF, 3.95 MB
english, 2007