[IEEE 2006 IEEE/ACM International Conference on Computer Aided Design - Double Tree Hotel, San Jose, CA,USA (2006.11.5-2006.11.9)] 2006 IEEE/ACM International Conference on Computer Aided Design - A Novel Framework for Faster-than-at-Speed Delay Test Considering IR-drop Effects
Ahmed, Nisar, Tehranipoor, Mohammad, Jayaram, VinayYear:
2006
Language:
english
DOI:
10.1109/iccad.2006.320136
File:
PDF, 7.61 MB
english, 2006