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[IEEE 2010 IEEE Holm Conference on Electrical Contacts (Holm 2010) - Charleston, SC, USA (2010.10.4-2010.10.7)] 2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts - Microswitch Lifecycle Test Fixture for Simultaneously Measuring Contact Resistance (Rc) and Contact Force (Fc) in Controlled Ambient Environment
Edelmann, Thomas A., Coutu Jr., Ronald A.Year:
2010
Language:
english
DOI:
10.1109/holm.2010.5619527
File:
PDF, 1.08 MB
english, 2010