Fluence dependence of disorder depth profiles in Pb...

Radiation Effects 1980 / 01 Vol. 52; Iss. 3-4

Fluence dependence of disorder depth profiles in Pb implanted Si

Christodoulides, C. E., Kadhim, N. J., Carter, G.
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Volume:
52
Language:
english
Journal:
Radiation Effects
DOI:
10.1080/00337578008210035
Date:
January, 1980
File:
PDF, 708 KB
english, 1980
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