[IEEE 2013 24th Annual SEMI Advanced Semiconductor...

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[IEEE 2013 24th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2013) - Saratoga Springs, NY (2013.5.14-2013.5.16)] ASMC 2013 SEMI Advanced Semiconductor Manufacturing Conference - Use of performance path test to optimize yield

Bickford, Jeanne Paulette, Jinjun Xiong,
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Year:
2013
Language:
english
DOI:
10.1109/asmc.2013.6552806
File:
PDF, 488 KB
english, 2013
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