[IEEE 2013 24th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2013) - Saratoga Springs, NY (2013.5.14-2013.5.16)] ASMC 2013 SEMI Advanced Semiconductor Manufacturing Conference - Use of performance path test to optimize yield
Bickford, Jeanne Paulette, Jinjun Xiong,Year:
2013
Language:
english
DOI:
10.1109/asmc.2013.6552806
File:
PDF, 488 KB
english, 2013