[IEEE 2014 IEEE 11th International Conference on Semiconductor Electronics (ICSE) - Kuala Lumpur, Malaysia (2014.8.27-2014.8.29)] 2014 IEEE International Conference on Semiconductor Electronics (ICSE2014) - Statistical process modelling for 32nm high-K/metal gate PMOS device
Maheran, A. H. Afifah, Noor Faizah, Z. A., Menon, P. S., Ahmad, I., Apte, P.R., Kalaivani, T., Salehuddin, F.Year:
2014
Language:
english
DOI:
10.1109/smelec.2014.6920839
File:
PDF, 951 KB
english, 2014