![](/img/cover-not-exists.png)
[IEEE 2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Warsaw, Poland (2014.4.23-2014.4.25)] 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - Designing of Test Pattern Generators for stimulation of crosstalk faults in bus-type connections
Garbolino, TomaszYear:
2014
Language:
english
DOI:
10.1109/ddecs.2014.6868807
File:
PDF, 250 KB
english, 2014