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[IEEE 2001 International Semiconductor Device Research Symposium. Symposium - Washington, DC, USA (5-7 Dec. 2001)] 2001 International Semiconductor Device Research Symposium. Symposium Proceedings (Cat. No.01EX497) - A compact deep-submicron MOSFET g/sub ds/ model including hot-electron and thermoelectric effects
Zhou, X., Chiah, S.B., Lim, K.Y.Year:
2001
Language:
english
DOI:
10.1109/isdrs.2001.984606
File:
PDF, 291 KB
english, 2001