[IEEE 2012 24th International Conference on Microelectronics (ICM) - Algiers, Algeria (2012.12.16-2012.12.20)] 2012 24th International Conference on Microelectronics (ICM) - An accurate extraction methodology for NBTI induced degradation using charge pumping based methods
Tahi, Hakim, Djezzar, Boualem, Benabdelmoumene, Abdelmadjid, Chenouf, AmelYear:
2012
Language:
english
DOI:
10.1109/icm.2012.6471444
File:
PDF, 382 KB
english, 2012