[IEEE 2009 IEEE 59th Electronic Components and Technology Conference (ECTC 2009) - San Diego, CA, USA (2009.05.26-2009.05.29)] 2009 59th Electronic Components and Technology Conference - Fault-mode classification for health monitoring of electronics subjected to drop and shock
Lall, Pradeep, Gupta, Prashant, Panchagade, Dhananjay, Angral, ArjunYear:
2009
Language:
english
DOI:
10.1109/ectc.2009.5074086
File:
PDF, 4.31 MB
english, 2009