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[IEEE 2007 European Microwave Integrated Circuit Conference - Munich, Germany (2007.10.8-2007.10.10)] 2007 European Microwave Integrated Circuit Conference - Current gain collapse in HBTs analysed by transient interferometric mapping method
Bychikhin, Sergey, Dubec, Viktor, Kuzmik, Jan, Wurfl, Joachim, Kurpas, Paul, Teyssier, Jean-Pierre, Pogany, DionyzYear:
2007
Language:
english
DOI:
10.1109/emicc.2007.4412639
File:
PDF, 681 KB
english, 2007