Drift Modeling of Electrically Controlled Nanoscale...

IEEE Electron Device Letters 2008 / 07 Vol. 29; Iss. 7

Drift Modeling of Electrically Controlled Nanoscale Metal–Oxide Gas Sensors

Velasco-Velez, J. J., Chaiyboun, A., Wilbertz, C., Scheinert, S., Doll, T.
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Volume:
29
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2008.2000605
Date:
July, 2008
File:
PDF, 351 KB
english, 2008
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