[IEEE 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) - Bangalore, India (2007.01.6-2007.01.10)] 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) - Low Shift and Capture Power Scan Tests
Remersaro, Santiago, Lin, Xijiang, Reddy, Sudhakar, Pomeranz, Irith, Rajski, JanuszYear:
2007
Language:
english
DOI:
10.1109/vlsid.2007.101
File:
PDF, 340 KB
english, 2007