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[IEEE 2011 IEEE/MTT-S International Microwave Symposium - MTT 2011 - Baltimore, MD, USA (2011.06.5-2011.06.10)] 2011 IEEE MTT-S International Microwave Symposium - Fast physical models for Si LDMOS power transistor characterization
Everett, John P., Kearney, Michael J., Rueda, Hernan A., Johnson, Eric M., Aaen, Peter H., Wood, John, Snowden, Christopher M.Year:
2011
Language:
english
DOI:
10.1109/mwsym.2011.5972839
File:
PDF, 611 KB
english, 2011