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[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Charge diffusion in silicon nitrides: Scalability assessment of nitride based flash memory
Baik, Seung Jae, Lim, Koeng Su, Choi, Wonsup, Yoo, Hyunjun, Shin, HyunjungYear:
2011
Language:
english
DOI:
10.1109/irps.2011.5784550
File:
PDF, 1.08 MB
english, 2011