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[IEEE 40th Conference on Electronic Components and Technology - Las Vegas, NV, USA (20-23 May 1990)] 40th Conference Proceedings on Electronic Components and Technology - Progression of damage caused by temperature cycling on a large die in a molded plastic package

Lesk, I.A., Thomas, R.E., Hawkins, G., Remmel, T.P., Rugg, J.
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Year:
1990
Language:
english
DOI:
10.1109/ectc.1990.122282
File:
PDF, 756 KB
english, 1990
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