Sensitivity Studies on Vacuum Deposited V2O5 Thin Films
Dhayal Raj, A., Suresh Kumar, P., Sabari Arul, N., Mangalaraj, D., Irudayaraj, A. AlbertVolume:
678
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/amr.678.42
Date:
March, 2013
File:
PDF, 321 KB
english, 2013