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[IEEE 2012 24th International Conference on Microelectronics (ICM) - Algiers, Algeria (2012.12.16-2012.12.20)] 2012 24th International Conference on Microelectronics (ICM) - Impact of the inhomogeneous structure of the active layer on the transfer characteristic of polysilicon TFT's
Tayoub, Hadjira, Bensmain, Asmaa, Zebentout, Baya, Benamara, ZinebYear:
2012
Language:
english
DOI:
10.1109/icm.2012.6471393
File:
PDF, 1000 KB
english, 2012