[IEEE IEEE MTT-S International Microwave Symposium Digest, 2005. - Long Beach, CA, USA (12-17 June 2005)] IEEE MTT-S International Microwave Symposium Digest, 2005. - Dynamic Gate Bias Technique for Improved Linearity of GaN HFET Power Amplifiers
Conway, A., Yu Zhao,, Asbeck, P., Micovic, M., Jeong Moon,Year:
2005
Language:
english
DOI:
10.1109/mwsym.2005.1516639
File:
PDF, 245 KB
english, 2005