![](/img/cover-not-exists.png)
SET Characterization in Logic Circuits Fabricated in a 3DIC Technology
Gouker, Pascale M., Tyrrell, Brian, Renzi, Matthew, Chen, Chenson, Wyatt, Peter, Ahlbin, Jonathan R., Weeden-Wright, Stephanie, Atkinson, Nick M., Gaspard, Nelson J., Bhuva, Bharat L., Massengill, LloVolume:
58
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2011.2172462
Date:
December, 2011
File:
PDF, 1.46 MB
english, 2011