[IEEE 2008 9th International Conference on Solid-State and...

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[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - Low-k breakdown improvement in 65nm dual-damascene Cu process

Wang, Qi, Gan, Howard, Zhao, Linlin, Zheng, Kevin, Bei, Emily, Ning, Jay
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Year:
2008
Language:
english
DOI:
10.1109/icsict.2008.4734786
File:
PDF, 1.96 MB
english, 2008
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