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[IEEE Conference on Electrical Insulation and Dielectric Phenomena - Leesburg, VA, USA (29 Oct.-2 Nov. 1989)] Conference on Electrical Insulation and Dielectric Phenomena - Measuring distribution of carrier trap energy state density at interface of dielectric with step pressure wave method
Zhang Yewen,, Yang Baitun,, Tu Demin,, Liu Yaonan,Year:
1989
Language:
english
DOI:
10.1109/ceidp.1989.69563
File:
PDF, 195 KB
english, 1989