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[IEEE 2006 IEEE Autotestcon - Anaheim, CA, USA (2006.09.18-2006.09.21)] 2006 IEEE Autotestcon - A Framework for Improved Automated Test and Costwise Life-Cycle Support
Kalgren, Patrick, Almeida, Priya, Donovan, Bryan, Rus, TeofilYear:
2006
Language:
english
DOI:
10.1109/autest.2006.283762
File:
PDF, 6.78 MB
english, 2006