[IEEE 2009 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT 2009) - Singapore (2009.01.9-2009.12.11)] 2009 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT) - On the accuracy of de-embedding technologies for on-wafer measurement up to 170GHz
Bo Zhang,, Yong-Zhong Xiong,, Lei Wang,, Lim Teck-Guan,, Yi-Qi Zhuang,, Le-Wei Li,, Xiaojun Yuan,Year:
2009
Language:
english
DOI:
10.1109/rfit.2009.5383696
File:
PDF, 859 KB
english, 2009