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[IEEE 2007 International Symposium on VLSI Design, Automation and Test - Hsinchu, Taiwan (2007.04.25-2007.04.27)] 2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Efficient Calculation of Timed Cumulative Probability Density Function
Su, Yu-Shih, Weng, Yi-Hsin, Chang, Shih-ChiehYear:
2007
Language:
english
DOI:
10.1109/vdat.2007.373252
File:
PDF, 4.61 MB
english, 2007