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[IEEE 2011 International Conference on Wavelet Analysis and Pattern Recognition (ICWAPR) - Guilin, China (2011.07.10-2011.07.13)] 2011 International Conference on Wavelet Analysis and Pattern Recognition - Statistical texture classifcation via histograms of wavelet filtered images
Liew, Alan Wee-Chung, Jo, Jun, Chae, Tae Byong, Chun, Yong-SikYear:
2011
Language:
english
DOI:
10.1109/icwapr.2011.6014488
File:
PDF, 225 KB
english, 2011