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The influence of Al morphology on quality in Nb/Al/AlO/sub x//Al/Nb epitaxial base layer junctions
Kirk, E.C.G., Blamire, M.G., Somekh, R.E., Evetts, J.E.Volume:
3
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/77.233935
Date:
March, 1993
File:
PDF, 661 KB
english, 1993