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[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - Miniature radio frequency ion trap mass spectrometry
Maas, Jeffrey D., Xu, Wei, Hendricks, Paul, Chappell, William J.Year:
2010
Language:
english
DOI:
10.1109/mwsym.2010.5516819
File:
PDF, 889 KB
english, 2010