[IEEE International Technical Digest on Electron Devices - San Francisco, CA, USA (9-12 Dec. 1990)] International Technical Digest on Electron Devices - Identification of 1/f diffusion and recombination noise sources in bipolar transistors
Decoutere, S., Deferm, L., Vanhorebeek, G., Claeys, C., Declerck, G.Year:
1990
Language:
english
DOI:
10.1109/iedm.1990.237234
File:
PDF, 356 KB
english, 1990