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[IEEE International Technical Digest on Electron Devices - San Francisco, CA, USA (9-12 Dec. 1990)] International Technical Digest on Electron Devices - Identification of 1/f diffusion and recombination noise sources in bipolar transistors

Decoutere, S., Deferm, L., Vanhorebeek, G., Claeys, C., Declerck, G.
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Year:
1990
Language:
english
DOI:
10.1109/iedm.1990.237234
File:
PDF, 356 KB
english, 1990
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