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[IEEE Comput. Soc 15th International Conference on Pattern Recognition - Barcelona, Spain (3-7 Sept. 2000)] Proceedings 15th International Conference on Pattern Recognition. ICPR-2000 - Comparison of face verification results on the XM2VTFS database
Matas, J., Hamouz, M., Jonsson, K., Kittler, J., Li, Y., Kotropoulos, C., Tefas, A., Pitas, I., Teewoon Tan,, Hong Yan,, Smeraldi, F., Bigun, J., Capdevielle, N., Gerstner, W., Ben-Yacoub, S., AbeljVolume:
4
Year:
2000
Language:
english
DOI:
10.1109/icpr.2000.903052
File:
PDF, 483 KB
english, 2000