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[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - Effects of surface traps on the breakdown voltage of passivated AlGaN/GaN HEMTs under high-field stress
Zhao, Zi-Qi, Liao, De-Wei, Du, Jiang-FengYear:
2012
Language:
english
DOI:
10.1109/icsict.2012.6467595
File:
PDF, 753 KB
english, 2012