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[IEEE 2013 IEEE International Symposium on Circuits and Systems (ISCAS) - Beijing (2013.5.19-2013.5.23)] 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013) - Multiple-pulse dynamic stability and failure analysis of low-voltage 6T-SRAM bitcells in 28nm UTBB-FDSOI
Akyel, Kaya Can, Ciampolini, Lorenzo, Thomas, Olivier, Pelloux-Prayer, Bertrand, Kumar, Shishir, Flatresse, Philippe, Lecocq, Christophe, Ghibaudo, GerardYear:
2013
Language:
english
DOI:
10.1109/iscas.2013.6572130
File:
PDF, 242 KB
english, 2013