[IEEE 2011 International Conference on Wavelet Analysis and Pattern Recognition (ICWAPR) - Guilin, China (2011.07.10-2011.07.13)] 2011 International Conference on Wavelet Analysis and Pattern Recognition - Application of wavelet transform in optical thin film defect automatic inspection system
Kuo, Chung-Feng Jeffrey, Chiu, Chin-Hsun, Peng, Kai-ChingYear:
2011
Language:
english
DOI:
10.1109/icwapr.2011.6014486
File:
PDF, 167 KB
english, 2011