[IEEE 2010 IEEE International Frequency Control Symposium (FCS) - Newport Beach, CA, USA (2010.06.1-2010.06.4)] 2010 IEEE International Frequency Control Symposium - Noise analysis of the opto-electronic microwave oscillator (OEO)
Salzenstein, P., Brendel, R., Koumou Chembo, Y., Volyanskiy, K., Larger, L., Rubiola, E.Year:
2010
Language:
english
DOI:
10.1109/freq.2010.5556270
File:
PDF, 296 KB
english, 2010