![](/img/cover-not-exists.png)
[IEEE 18th International Reliability Physics Symposium - Las Vegas, NV, USA (1980.04.8-1980.04.10)] 18th International Reliability Physics Symposium - Deformation of AL Metallization in Plastic Encapsulated Semiconductor Devices Caused by Thermal Shock
Isagawa, Masaaki, Iwasaki, Yuzi, Sutoh, TamotsuYear:
1980
Language:
english
DOI:
10.1109/irps.1980.362935
File:
PDF, 5.48 MB
english, 1980