[IEEE 2008 International Solid-State Circuits Conference - (ISSCC) - San Francisco, CA, USA (2008.02.3-2008.02.7)] 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers - A Commercial Field-Programmable Dense eFUSE Array Memory with 99.999% Sense Yield for 45nm SOI CMOS
Uhlmann, Greg, Aipperspach, Tony, Kirihata, Toshiaki, Kothandaraman, Chandrasekharan, Li, Yan Zun, Paone, Chris, Reed, Brian, Robson, Norman, Safran, John, Schmitt, David, Iyer, SubramanianYear:
2008
Language:
english
DOI:
10.1109/isscc.2008.4523229
File:
PDF, 411 KB
english, 2008