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[IEEE 2009 IEEE International Conference on IC Design and Technology (ICICDT) - Austin, TX, USA (2009.05.18-2009.05.20)] 2009 IEEE International Conference on IC Design and Technology - Impact of gate-oxide breakdown on power-gated SRAM
Hao-I Yang,, Ching-Te Chuang,, Wei Hwang,Year:
2009
Language:
english
DOI:
10.1109/icicdt.2009.5166273
File:
PDF, 418 KB
english, 2009