Persistent Current Reduction in Metal-Semiconductor FETs...

IEEE Electron Device Letters 2013 / 10 Vol. 34; Iss. 10

Persistent Current Reduction in Metal-Semiconductor FETs With a ZnCoO Channel in an External Magnetic Field

Kaspar, Tim, Fiedler, Jan, Skorupa, Ilona, Burger, Danilo, Mucklich, Arndt, Fritzsche, Monika, Schmidt, Oliver G., Schmidt, Heidemarie
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Volume:
34
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2013.2278538
Date:
October, 2013
File:
PDF, 362 KB
english, 2013
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