Embedding techniques for irradiation-induced defects in...

IEEE Transactions on Nuclear Science 2002 / 06 Vol. 49; Iss. 3

Embedding techniques for irradiation-induced defects in crystalline SiO/sub 2/

Edwards, A.H., Sushko, P.V., Shluger, A.L., Sulimov, V.B.
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Volume:
49
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2002.1039671
Date:
June, 2002
File:
PDF, 316 KB
english, 2002
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