![](/img/cover-not-exists.png)
[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - An empirical lifetime projection method for laser diode degradation
Nam Hwang,, Seung-Goo Kang,, Hee-Tae Lee,, Seong-Su Park,, Min-Kyu Song,, Kwang-Eui Pyun,Year:
1997
Language:
english
DOI:
10.1109/relphy.1997.584272
File:
PDF, 262 KB
english, 1997