[IEEE Comput. Soc. Press IEEE Conference on Computer Vision and Pattern Recognition - New York, NY, USA (15-17 June 1993)] Proceedings of IEEE Conference on Computer Vision and Pattern Recognition - Matching elastic contours
Geiger, D., Vlontzos, J.A.Year:
1993
Language:
english
DOI:
10.1109/cvpr.1993.341065
File:
PDF, 227 KB
english, 1993