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[IEEE 2010 8th IEEE International Conference on Industrial Informatics (INDIN) - Osaka, Japan (2010.07.13-2010.07.16)] 2010 8th IEEE International Conference on Industrial Informatics - Determining the worst-case reaction time of IEC 61499 function blocks
Kuo, Matthew M Y, Yoong, Li Hsien, Andalam, Sidharta, Roop, Partha SYear:
2010
Language:
english
DOI:
10.1109/indin.2010.5549585
File:
PDF, 880 KB
english, 2010