[IEEE 2010 IEEE Workshop on Biometric Measurements and...

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[IEEE 2010 IEEE Workshop on Biometric Measurements and Systems for Security and Medical Applications (BIOMS) - Taranto, Italy (2010.09.9-2010.09.9)] 2010 IEEE Workshop on Biometric Measurements and Systems for Security and Medical Applications - Revisiting clustering methods to their application on keystroke dynamics for intruder classification

Zamonsky Pedernera, Gissel, Sznur, Sebastian, Sorondo Ovando, Gustavo, Garcia, Sebastian, Meschino, Gustavo
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Year:
2010
Language:
english
DOI:
10.1109/bioms.2010.5610443
File:
PDF, 535 KB
english, 2010
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