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Characterization of three-dimensional grain boundary topography in a YBa[sub 2]Cu[sub 3]O[sub 7−d] thin film bicrystal grown on a SrTiO[sub 3] substrate
Ayache, J., Thorel, A., Lesueur, J., Dahmen, U.Volume:
84
Year:
1998
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.368736
File:
PDF, 1.12 MB
english, 1998