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[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - Wafer-Level Characterization of Probecards using NAC Probing
Gyu-Yeol Kim,, Eon-Jo Byunb,, Ki-Sang Kang,, Young-Hyun Junc,, Bai-Sun Kong,Year:
2008
Language:
english
DOI:
10.1109/test.2008.4700571
File:
PDF, 1.39 MB
english, 2008