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[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Investigation of GIDL current Injection Disturb Mechanism in two-transistor-eNVM memory devices
Kim, Sung-Rae, Han, K. J., Lee, Junmin, Lee, P. Y., Zhou, Tony, Lee, Kin-Sing, Liu, Patty, Tseng, Huan-Chung, Cronguist, BrianYear:
2008
Language:
english
DOI:
10.1109/irws.2008.4796128
File:
PDF, 666 KB
english, 2008