Lateral resolution and potential sensitivity in Kelvin...

Lateral resolution and potential sensitivity in Kelvin probe force microscopy: Towards understanding of the sub-nanometer resolution

Krok, F., Sajewicz, K., Konior, J., Goryl, M., Piatkowski, P., Szymonski, M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
77
Language:
english
Journal:
Physical Review B
DOI:
10.1103/physrevb.77.235427
Date:
June, 2008
File:
PDF, 510 KB
english, 2008
Conversion to is in progress
Conversion to is failed