Lateral resolution and potential sensitivity in Kelvin probe force microscopy: Towards understanding of the sub-nanometer resolution
Krok, F., Sajewicz, K., Konior, J., Goryl, M., Piatkowski, P., Szymonski, M.Volume:
77
Language:
english
Journal:
Physical Review B
DOI:
10.1103/physrevb.77.235427
Date:
June, 2008
File:
PDF, 510 KB
english, 2008