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[IEEE 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. - Cannes, France (10-13 Oct. 2004)] 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. - IC HTOL test stress condition optimization
Peng, B., Ing-Yi Chen,, Sy-Yen Kuo,, Bolger, C.Year:
2004
Language:
english
DOI:
10.1109/dftvs.2004.1347849
File:
PDF, 355 KB
english, 2004