Thermal Resistance Characterization of Implanted...

IEEE Transactions on Device and Materials Reliability 2004 / 12 Vol. 4; Iss. 4

Thermal Resistance Characterization of Implanted Subcollector InP-Based HBTs

Fields, C.H., Chen, M.Y., Royter, Y., Sokolich, M.
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Volume:
4
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2004.840123
Date:
December, 2004
File:
PDF, 497 KB
english, 2004
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