[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Matching properties of MOS transistors and delay line chains with self-aligned source/drain contacts
Bolt, M., Cantatore, E., Socha, M., Aussems, C., Solo, J.Year:
1996
Language:
english
DOI:
10.1109/icmts.1996.535616
File:
PDF, 566 KB
english, 1996